• Awards for the best presentations of YSC-2014 (2nd prize)
• Awards for the best presentations of YSF-2017
• CERTIFICATE "DIGITAL AGE: BIG DATA, AI & COPYRIGHT"
• CERTIFICATE OF ATTENDANCE 11th International Conference "Measurement-2017"
• CERTIFICATE OF ATTENDANCE 12th International Conference "Measurement-2019"
• CERTIFICATE OF ATTENDANCE 14th International Workshop "UM-2017"
• CERTIFICATE OF ATTENDANCE 15th International Workshop "UM-2018"
• CERTIFICATE OF ATTENDANCE 27th International Scientific Symposium "Metrology and Metrology Assurence 2017"
• CERTIFICATE OF ATTENDANCE 28th International Scientific Symposium "Metrology and Metrology Assurence 2019"-1
• CERTIFICATE OF ATTENDANCE 28th International ІScientific Symposium "Metrology and Metrology Assurence 2018"
• CERTIFICATE OF ATTENDANCE 29-th International Scientific Symposium "Metrology and Metrology Assurence 2019"-2
• CERTIFICATE OF ATTENDANCE 45th Annual Conference "IECON-2019"
• CERTIFICATE OF ATTENDANCE 45th International Conference "IECON'2019"
• CERTIFICATE OF ATTENDANCE 8th IEEE International Conference on Advanced Optoelectronics & Lasers, CAOL*2019, and contributed with poster presentation titled “Adaptation of the least squares method for determination of oscillating type measuring devices parameters with using gain-frequency characteristic”
• CERTIFICATE OF ATTENDANCE 8th IEEE International Conference on Advanced Optoelectronics & Lasers, CAOL*2019, and contributed with poster presentation titled “Configurable Cell Segmentation Solution Using Hough Circles Transform and Watershed Algorithm”
• CERTIFICATE OF ATTENDANCE 8th IEEE International Conference on Advanced Optoelectronics & Lasers, CAOL*2019, and contributed with poster presentation titled “Laser System for Recording Optics”
• CERTIFICATE OF ATTENDANCE 8th IEEE International Conference on Advanced Optoelectronics & Lasers, CAOL*2019, and contributed with poster presentation titled “The measurement uncertainty analysis of the oil concentration in the sunflower seed”
• CERTIFICATE OF ATTENDANCE 8th IEEE International Conference on Advanced Optoelectronics & Lasers, CAOL*2019, as invited speaker with presentation titled “Revision GUM: the Suggested Algorithm for Processing Measurement Results”
• CERTIFICATE OF ATTENDANCE JOJNT SYMPOSIUM IMEKO-2019
• CERTIFIED PUBLONS ACADEMY MENTOR
• CRDFGLOBAL Certificate # 82516096 "Entrepreneurship Development under the Science and Technology Entrepreneurship Program (STEP)"
• Certificate B2 Wildau
• Certificate Mentor of the Team Intellectronics Finalist Imagine Cup EGYPT-2009 Microsoft
• Certificate Mentor of the Team Intellectronics Finalist Imagine Cup FRANCE-2008 Microsoft
• Certificate XIV International Conference "Strategy of quality in Industry and education"